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Volumn 56, Issue 11, 2001, Pages 2127-2136

Total-reflection X-ray fluorescence - A tool to obtain information about different air masses and air pollution

Author keywords

Air masses; Atmospheric aerosols; Chicago; Total reflection X ray fluorescence

Indexed keywords

ATMOSPHERIC AEROSOLS; COMPOSITION; METEOROLOGY; MICROWAVE OVENS; TRACE ELEMENTS; WIND EFFECTS; X RAY SPECTROMETERS;

EID: 0035976285     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(01)00284-1     Document Type: Conference Paper
Times cited : (19)

References (24)
  • 23
    • 67049149949 scopus 로고    scopus 로고
    • (2000)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.