Trace element analysis using a benchtop total reflection X-ray fluorescence spectrometer

Powder Diffraction

Volumn 20, Issue 2, 2005, Pages 141-145

  Stosnach, Hagen ^a  

^a RONTEC GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ADSORPTION SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROSCOPY; TOTAL REFLECTION X-RAY FLUORESCENCE; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; TRACE ELEMENT ANALYSIS;

EMISSION SPECTROSCOPY; HEAVY METALS; INDUCTIVELY COUPLED PLASMA; SEWAGE;

ELECTROMAGNETIC WAVE REFLECTION;

EID: 31144448148     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1913723     Document Type: Conference Paper

References (11)

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