Survey of sampling techniques for solids suitable for microanalysis by total-reflection X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry

Volumn 14, Issue 4, 1999, Pages 571-576

  Klockenkämper, Reinhold ^a   Von Bohlen, Alex ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; EMISSION SPECTROSCOPY; MICROANALYSIS; SAMPLING; X RAY SPECTROSCOPY;

SOLID SAMPLING; TOTAL-REFLECTION X RAY FLUORESCENCE (TXRF) SPECTROMETRY;

SPECTROMETRY;

EID: 0041415232     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a807693f     Document Type: Article

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