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Volumn 80, Issue 22, 2008, Pages 8372-8381
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Uncertainty in the multielemental quantification by total-reflection X-ray fluorescence: Theoretical and empirical approximation
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Author keywords
[No Author keywords available]
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Indexed keywords
CABLE STAYED BRIDGES;
LITHIUM;
POLYNOMIAL APPROXIMATION;
QUALITY ASSURANCE;
SILICON;
TOTAL QUALITY MANAGEMENT;
ANALYTICAL RESULTS;
COMPTON;
EMPIRICAL APPROXIMATIONS;
EMPIRICAL UNCERTAINTIES;
GEOMETRICAL VARIATIONS;
NON LINEARITIES;
SAMPLE DEPOSITIONS;
SI DETECTORS;
SOURCES OF UNCERTAINTIES;
THEORETICAL MODELS;
UNCERTAINTY SOURCES;
VARIATIONS OF;
X-RAY FLUORESCENCES;
UNCERTAINTY ANALYSIS;
ARTICLE;
COMPTON EFFECT;
EMPIRICISM;
GEOMETRY;
NONLINEAR SYSTEM;
QUANTUM MECHANICS;
THEORETICAL MODEL;
UNCERTAINTY;
X RAY FLUORESCENCE;
LINEAR MODELS;
QUALITY CONTROL;
SPECTROMETRY, X-RAY EMISSION;
UNCERTAINTY;
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EID: 56449117670
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac800780x Document Type: Article |
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Times cited : (38)
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References (19)
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