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Volumn 177, Issue 2-3, 2010, Pages 60-70

Photoelectron spectroscopy of liquid water and aqueous solution: Electron effective attenuation lengths and emission-angle anisotropy

Author keywords

Electron attenuation lengths in water; Electron inelastic mean free path; Liquid water and aqueous solutions; Molecular dynamics; Solution interfacial structure; X ray photoelectron spectroscopy

Indexed keywords

AQUEOUS SOLUTIONS; ELECTRON ATTENUATION LENGTHS; ELECTRON ATTENUATION LENGTHS IN WATER; ELECTRON INELASTIC MEAN FREE PATHS; INTERFACIAL STRUCTURES; LIQUID WATER; MOLECULAR DYNAMICS SOLUTIONS;

EID: 77950626769     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.08.007     Document Type: Article
Times cited : (175)

References (52)
  • 6
    • 0003860280 scopus 로고
    • Cardona M., Fulde P., von Klitzing K., and Queisser H.-J. (Eds), Springer-Verlag, Berlin/Heidelberg/New York/London/Paris/Tokyo/Hong Kong/Barcelona/Budapest
    • Hüfner S. In: Cardona M., Fulde P., von Klitzing K., and Queisser H.-J. (Eds). Photoelectron Spectroscopy: Principles and Applications (1995), Springer-Verlag, Berlin/Heidelberg/New York/London/Paris/Tokyo/Hong Kong/Barcelona/Budapest
    • (1995) Photoelectron Spectroscopy: Principles and Applications
    • Hüfner, S.1
  • 7
    • 0004222424 scopus 로고
    • Feuerbacher B., Fitton B., and Willis R.F. (Eds), John Wiley & Sons, Chichester/New York/Brisbane/Toronto
    • Feuerbacher B. In: Feuerbacher B., Fitton B., and Willis R.F. (Eds). Photoemission and the Electronic Properties of Surfaces (1978), John Wiley & Sons, Chichester/New York/Brisbane/Toronto
    • (1978) Photoemission and the Electronic Properties of Surfaces
    • Feuerbacher, B.1
  • 12
    • 77950630405 scopus 로고    scopus 로고
    • W.S.M. Werner, W. Smekal, C.J. Powell, NIST database for the simulation of electron spectra for surface analysis, version 1.1, Standard Reference Data Program Database 100, US Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, 2005 (http://www.nist.gov/srd/nist100.htm).
    • W.S.M. Werner, W. Smekal, C.J. Powell, NIST database for the simulation of electron spectra for surface analysis, version 1.1, Standard Reference Data Program Database 100, US Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, 2005 (http://www.nist.gov/srd/nist100.htm).
  • 36
    • 0004195760 scopus 로고    scopus 로고
    • University of California, San Francisco
    • Case D.A., et al. AMBER 7 (2002), University of California, San Francisco
    • (2002) AMBER 7
    • Case, D.A.1
  • 45
    • 12844249938 scopus 로고    scopus 로고
    • Ghosal S., et al. Science 307 (2005) 563-566
    • (2005) Science , vol.307 , pp. 563-566
    • Ghosal, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.