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Volumn 256, Issue 15, 2010, Pages 4839-4844
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Spectroscopic ellipsometry study of the dielectric response of Au-In and Ag-Sn thin-film couples
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Author keywords
Dielectric function; Interdiffusion in nanoscale solids; Intermetallic compounds; Optical resistivity; Spectroscopic ellipsometry; X ray diffractometry
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Indexed keywords
BINARY ALLOYS;
DEPOSITION;
GOLD DEPOSITS;
INDIUM ALLOYS;
INTERMETALLICS;
OPTICAL PROPERTIES;
PHASE COMPOSITION;
PRECIOUS METALS;
SILVER ALLOYS;
SPECTROSCOPIC ELLIPSOMETRY;
TIN ALLOYS;
ULTRATHIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ATOMIC CONCENTRATION;
COMPLEX DIELECTRIC FUNCTIONS;
DIELECTRIC FUNCTIONS;
DIELECTRIC RESPONSE;
DRUDE-LORENTZ MODEL;
MULTI PHASE SYSTEMS;
NANOSCALE SOLIDS;
OPTICAL RESISTIVITY;
GOLD ALLOYS;
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EID: 77950594075
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2010.01.113 Document Type: Article |
Times cited : (22)
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References (41)
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