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Volumn 256, Issue 15, 2010, Pages 4839-4844

Spectroscopic ellipsometry study of the dielectric response of Au-In and Ag-Sn thin-film couples

Author keywords

Dielectric function; Interdiffusion in nanoscale solids; Intermetallic compounds; Optical resistivity; Spectroscopic ellipsometry; X ray diffractometry

Indexed keywords

BINARY ALLOYS; DEPOSITION; GOLD DEPOSITS; INDIUM ALLOYS; INTERMETALLICS; OPTICAL PROPERTIES; PHASE COMPOSITION; PRECIOUS METALS; SILVER ALLOYS; SPECTROSCOPIC ELLIPSOMETRY; TIN ALLOYS; ULTRATHIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 77950594075     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.01.113     Document Type: Article
Times cited : (22)

References (41)
  • 20
    • 85038905104 scopus 로고
    • Okamoto H., and Massalski T.B. (Eds), ASM International, Metals Park, OH
    • In: Okamoto H., and Massalski T.B. (Eds). Phase Diagrams of Binary Gold Alloys (1987), ASM International, Metals Park, OH 142
    • (1987) Phase Diagrams of Binary Gold Alloys , pp. 142


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.