A model-based approach to compensate for the dynamics convolution effect on nanomechanical property measurement

Journal of Applied Physics

Volumn 107, Issue 6, 2010, Pages

  Xu, Zhonghua ^a   Zou, Qingze ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FORCES; CREEP COMPLIANCE; EXCITATION FORCE; MEASUREMENT FREQUENCY; MECHANICAL BEHAVIOR; MODEL BASED APPROACH; MULTIPLE FREQUENCY; NANO-MECHANICAL BEHAVIORS; NANOMECHANICAL PROPERTY; NUMERICAL FITTING; PROBE-SAMPLE INTERACTIONS; SCANNING PROBE MICROSCOPE; SOFT MATERIAL; VISCOELASTIC MODELS;

CONVOLUTION; INSTRUMENT ERRORS; MATERIALS PROPERTIES; MEASUREMENT ERRORS; MECHANICAL PROPERTIES; PROBES; SCANNING; SILICONES; VISCOELASTICITY;

VIBRATIONS (MECHANICAL);

EID: 77950568092     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3327450     Document Type: Conference Paper

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