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Volumn 93, Issue 13, 2008, Pages

Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; FORCE MEASUREMENT; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SCANNING; SELF PHASE MODULATION; STATISTICAL PROCESS CONTROL; TELECOMMUNICATION SYSTEMS;

EID: 53349090023     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2990759     Document Type: Article
Times cited : (31)

References (10)
  • 6
    • 53349109748 scopus 로고    scopus 로고
    • Proceedings of the American Control Conference, Seattle, WA, (IEEE)
    • K. -S. Kim and Q. Zou, Proceedings of the American Control Conference, Seattle, WA, 2008 (IEEE), pp. 2210-2215.
    • (2008) , pp. 2210-2215
    • Kim, K.-S.1    Zou, Q.2
  • 7
    • 52649092491 scopus 로고    scopus 로고
    • Proceedings of the American Control Conference, Seattle, WA, (IEEE)
    • Y. Li and J. Bechhoefer, Proceedings of the American Control Conference, Seattle, WA, 2008 (IEEE), pp. 2703-2709.
    • (2008) , pp. 2703-2709
    • Li, Y.1    Bechhoefer, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.