|
Volumn 93, Issue 13, 2008, Pages
|
Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELASTICITY;
FORCE MEASUREMENT;
NANOSTRUCTURED MATERIALS;
NANOTECHNOLOGY;
SCANNING;
SELF PHASE MODULATION;
STATISTICAL PROCESS CONTROL;
TELECOMMUNICATION SYSTEMS;
BROAD FREQUENCY RANGE;
BROADBAND MEASUREMENTS;
CONTROL APPROACHES;
DEVELOPED MODEL;
DI-METHYLSILOXANE;
HYSTERESIS EFFECTS;
ITERATIVE CONTROL;
MATE RIAL PROPERTIES;
MECHANICAL CHARACTERIZATIONS;
NANO SCALING;
SCANNING PROBE MICROSCOPE;
THREE ORDERS OF MAGNITUDE;
MEASUREMENT ERRORS;
|
EID: 53349090023
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2990759 Document Type: Article |
Times cited : (31)
|
References (10)
|