Insights into the origin of threading dislocations in GaN/Al 2O3 from atomic force microscopy

Applied Physics Letters

Volumn 89, Issue 1, 2006, Pages

  Oliver, Rachel A ^a   Kappers, Menno J ^a   Humphreys, Colin J ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COALESCENCE; CRYSTAL ORIENTATION; DENSITY (SPECIFIC GRAVITY); DISLOCATIONS (CRYSTALS);

DISLOCATION CLUSTERS; DISLOCATION DENSITY; MISORIENTED ISLANDS; THREADING DISLOCATIONS;

GALLIUM NITRIDE;

EID: 33745797880     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2219747     Document Type: Article

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