Ultrafast soft X-ray scattering and reference-enhanced diffractive imaging of weakly scattering nanoparticles

Journal of Electron Spectroscopy and Related Phenomena

Volumn 166-167, Issue 1-3 C, 2008, Pages 65-73

  Boutet, Sébastien ^a,c   Bogan, Michael J ^b   Barty, Anton ^b   Frank, Matthias ^b   Benner, W Henry ^b   Marchesini, Stefano ^b,d   Seibert, M Marvin ^c   Hajdu, Janos ^a,c   Chapman, Henry N ^b  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UPPSALA UNIVERSITY   (Sweden)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Soft X ray free electron laser; Spherical nanoparticles; X ray diffractive imaging

Indexed keywords

DIFFRACTION; DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; FREE ELECTRON LASERS; HOLOGRAPHIC INTERFEROMETRY; INTERFEROMETRY; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NITRIDES; PARTICLE SIZE ANALYSIS; POLYSTYRENES; SILICON; SILICON NITRIDE; SPHERES; X RAY DIFFRACTION; X RAYS;

AND SCATTERINGS; COHERENT DIFFRACTIONS; COUNTING STATISTICS; DIFFERENTIAL MOBILITY ANALYSES; DIFFRACTIVE IMAGING; HIGH-RESOLUTION; IMAGING; PHASE RETRIEVALS; POLYSTYRENE SPHERES; REAL SPACES; REFERENCE OBJECTS; SCATTERING OBJECTS; SIGNAL INTENSITIES; SILICON NITRIDE MEMBRANES; SOFT-X-RAY FREE-ELECTRON-LASER; SPHERICAL NANOPARTICLES; SUPPORTED NANOPARTICLES; ULTRAFAST; ULTRAFAST PULSES; X-RAY DIFFRACTIVE IMAGING;

SCATTERING;

EID: 54849437480     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2008.06.004     Document Type: Article

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