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Volumn 10, Issue 3, 2010, Pages 1443-1450

Characterization of Proton Transfer in Co-Crystals by X-ray Photoelectron Spectroscopy (XPS)

Author keywords

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Indexed keywords


EID: 77949383696     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg901545k     Document Type: Article
Times cited : (36)

References (66)
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    • Crystal engineering of organic cocrystals by the solid-state grinding approach
    • DOI 10.1007/b100995, Organic Solid State Reactions
    • Trask, A. V.; Jones, W. Crystal Engineering of Organic Cocrystals by the Solid-State Grinding Approach. In Organic Solid State Reactions; Toda, F., Ed.; Springer-Verlag: New York, 2005; pp 41-70. (Pubitemid 44420828)
    • (2005) Topics in Current Chemistry , vol.254 , pp. 41-70
    • Trask, A.V.1    Jones, W.2
  • 26
    • 77949349911 scopus 로고    scopus 로고
    • Martindale: The Complete Drug Reference; Sweetman, S. C., Ed.; Pharmaceutical Press: London
    • Martindale: The Complete Drug Reference; Sweetman, S. C., Ed.; Pharmaceutical Press: London, 2009; http://www.medicinescomplete. com.
    • (2009)
  • 34
    • 77949413780 scopus 로고    scopus 로고
    • The XPS of Polymers Database; Beamson, G., Briggs, D., Eds.; Surface Spectra Ltd.: Manchester
    • The XPS of Polymers Database; Beamson, G., Briggs, D., Eds.; Surface Spectra Ltd.: Manchester, 2000.
    • (2000)
  • 39
    • 77949343903 scopus 로고    scopus 로고
    • Kratos AXIS Ultra; Kratos Analytical: Manchester, U.K.
    • Kratos AXIS Ultra; Kratos Analytical: Manchester, U.K.; http://surface.kratos.com/Axis-Ultra-DLD/axisultradld.html
  • 40
    • 77949346462 scopus 로고    scopus 로고
    • Kratos AXIS Ultra spectroscopy mode; UK Surface Analysis Forum: Loughborough, U.K.
    • Kratos AXIS Ultra spectroscopy mode; UK Surface Analysis Forum: Loughborough, U.K., http://www.uksaf.org/news/news24. html
  • 41
    • 77949369250 scopus 로고    scopus 로고
    • AXIS Charge Balance System; Kratos Analytical: Manchester, U.K.
    • AXIS Charge Balance System; Kratos Analytical: Manchester, U.K.; http://www.kratos.com/Agen/neutral.html
  • 45
    • 0003828439 scopus 로고
    • Auger and X-ray Photoelectron Spectroscopy, 2nd ed.; Briggs, D.; Seah, M. P., Eds.; John Wiley & Sons: Chichester
    • Briggs, D.; Seah, M. P.; Sherwood, P. M. A. In Practical Surface Analysis, Volume 1: Auger and X-ray Photoelectron Spectroscopy, 2nd ed.; Briggs, D.; Seah, M. P., Eds.; John Wiley & Sons: Chichester, 1990.
    • (1990) Practical Surface Analysis , vol.1
    • Briggs, D.1    Seah, M.P.2    Sherwood, P.M.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.