The hemispherical deflector analyser revisited. II. Electron-optical properties

Journal of Electron Spectroscopy and Related Phenomena

Volumn 163, Issue 1-3, 2008, Pages 28-39

  Benis, E P ^a   Zouros, T J M ^a,b  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b UNIVERSITY OF CRETE   (Greece)

Author keywords

Electron spectroscopy; ESCA; Fringing fields; Hemispherical analyser; Paracentric hemispherical analyser

Indexed keywords

COMPUTER SIMULATION; DEFLECTION (STRUCTURES); ELECTRON SPECTROSCOPY; ELECTROOPTICAL EFFECTS; EQUATIONS OF MOTION; OPTICAL INSTRUMENT LENSES;

FRINGING FIELDS; HEMISPHERICAL DEFLECTOR ANALZER (HDA); LENS MAGNIFICATION; PARACENTRIC HEMISPHERICAL ANALYZERS;

OPTICAL SYSTEMS;

EID: 43849083749     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2008.02.001     Document Type: Article

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