Investigation of the accuracy of ion optics simulations using Kepler orbits in a spherical capacitor

International Journal of Mass Spectrometry

Volumn 261, Issue 2-3, 2007, Pages 115-133

  Zouros, T J M ^a,b   Sise, Omer ^c   Spiegelhalder, F M ^a   Manura, David J ^d  

^a UNIVERSITY OF CRETE   (Greece)

^b INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^c AFYON KOCATEPE UNIVERSITY   (Turkey)

^d Scientific Instrument Services Inc   (United States)

Author keywords

Electron spectroscopy; Electron optics simulations; Finite differences; Hemispherical analyzers; Ray tracing; Simion

Indexed keywords

EID: 33846910835     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2006.08.005     Document Type: Article

References (35)

1. Cubric D., Lencova B., Read F., and Zlamal J. Nucl. Instrum. Methods Phys. Res. A 427 (1999) 357
2. Read F.H. J. Comput. Phys. 133 (1997) 1
3. Dahl D.A. Int. J. Mass Spectrom. 200 (2000) 3
4. Martinez G., and Becker R. Optik 111 (2000) 113
5. S.I.S. Inc., Simion3dVersion 7.0, http://www.simion.com, 2005.
6. CPO programs, available on the web site http://www.electronoptics.com/.
7. Available from Vector Fields-software for electromagnetic desing, more information can be found on the web site http://www.vectorfields.[com/content/view/26/49/].
8. Sise O., Ulu M., and Dogan M. Nucl. Instrum. Methods Phys. Res. A 554 (2005) 114
9. Benis E.P., and Zouros T.J.M. Nucl. Instrum. Methods Phys. Res. A 440 (2000) 462
10. Vilppola J.H., Keisala J.T., and Tanskanen P.J. Rev. Sci. Instrum. 64 (1993) 2190
11. Wannberg B. Nucl. Instrum. Methods Phys. Res. A 239 (1985) 269
12. Parr A.C., and Southworth S.H. Nucl. Instrum. Methods Phys. Res. A 222 (1984) 221
13. Benis E.P., et al. Nucl. Instrum. Methods Phys. Res. B 146 (1998) 120
14. Benis E.P., Zamkov M., Richard P., and Zouros T.J.M. Phys. Rev. A 65 (2002) 064701
15. Benis E.P., et al. Phys. Rev. A 69 (2004) 052718
16. T.J.M. Zouros, E.P. Benis, J. Electron Spectrosc. Relat. Phenom. 125 (2002) 221; ibid. 142 (2005) 175.
17. Belov V.D., and Yavor M.I. Nucl. Instrum. Methods Phys. Res. A 470 (2001) 105
18. Azimonte C., et al. Braz. J. Phys. 33 (2003) 788
19. Cantoni M., and Bertacco R. Rev. Sci. Instrum. 75 (2004) 2387
20. Rachev M., Srama R., Srowig A., and Grun E. Nucl. Instrum. Methods Phys. Res. A 535 (2004) 162
21. David D.E., Popović D.B., Antic D., and Michl J. J. Chem. Phys. 121 (2004) 10542
22. Desai D., et al. J. Res. Natl. Inst. Stand. Technol. 110 (2005) 443
23. Antoine R., et al. Int. J. Mass Spectrom. 239 (2004) 1
24. Appelhans A.D., Delmore J.E., and Olson J.E. Int. J. Mass Spectrom. 241 (2005) 1
25. Filip V., Nicolaescu D., Tanemura M., and Okuyama F. Ultramicroscopy 89 (2001) 39
26. Knapp W., and Schleubner D. Appl. Surf. Sci. 251 (2005) 14
27. Milosavljevic A.R., et al. Meas. Sci. Technol. 16 (2005) 1997
28. Milosavljevic A.R., et al. J. Phys. B 39 (2006) 609
29. Sarkadi L., and Orban A. Meas. Sci. Technol. 17 (2006) 84
30. Dahl D.A. SIMION 3D v6.0 (1996), Idaho National Engineering Laboratory, Idaho Falls
31. Mohr P.J., and Taylor B.N. Rev. Mod. Phys. 77 (2005) 1
32. Nishigaki S., and Kanai S. Rev. Sci. Instrum. 57 (1986) 225
33. Sagara T., Boesten L., Nishida S., and Okada K. Rev. Sci. Instrum. 71 (2000) 4201
34. David J. Manura, private communications, 2006.
35. More details can be found at the link http://www.simion.com/tools/sc.