A new hemispherical analyser with 2-D PSD and focusing lens for use in 0° electron spectroscopy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 146, Issue 1-4, 1998, Pages 120-125

  Benis, E P ^a   Zaharakis, K ^a   Voultsidou, M M ^a   Zouros, T J M ^a   Stockli M ^b   Richard, P ^b   Hagmann, S ^b  

^a UNIVERSITY OF CRETE   (Greece)

^b KANSAS STATE UNIVERSITY   (United States)

Author keywords

0 Auger projectile spectroscopy; Binary Encounter electrons; Hemispherical electron spectrometer spectrograph

Indexed keywords

ATOMS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; IONS; MATHEMATICAL MODELS;

AUGER PROJECTILE SPECTROSCOPY; BINARY ENCOUNTER ELECTRON; ELASTIC ELECTRON SCATTERING; ION ATOM COLLISIONS; POSITION SENSITIVE DETECTOR;

AUGER ELECTRON SPECTROSCOPY;

EID: 0032477092     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00482-0     Document Type: Article

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