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Volumn 518, Issue 12, 2010, Pages 3320-3325

Nanograins dependent dielectric constant, tunability, phase transition, impedance spectroscopy and leakage current of (Pb1 - xSrx)TiO3 thin films

(4) Verma, Kuldeep Chand a Kotnala, R K b Verma, Vivek b Negi, N S a

a HIMACHAL PRADESH UNIVERSITY (India)

b NATIONAL PHYSICAL LABORATORY (India)

Author keywords

Electrical properties and measurements; Electronic devices; Nanostructures; Strontium

Indexed keywords

CARRIER TRANSPORT PROCESS; CHEMICAL SOLUTION DEPOSITION PROCESS; COLE-COLE MODELS; CONTINUUM OF STATE; DIELECTRIC CONSTANTS; ELECTRICAL PROPERTIES AND MEASUREMENTS; ELECTRONIC DEVICE; ELECTRONIC DEVICES; EMISSION OF ELECTRON; HIGHER FREQUENCIES; IMPEDANCE DATA; IMPEDANCE SPECTROSCOPY; LOW LOSS; METAL-FILM INTERFACES; NANO GRAINS; NANO-STRUCTURED; POOLE-FRENKEL EMISSION; SI SUBSTRATES; TEMPERATURE DEPENDENT; TIO; TRAP STATE; TUNABILITIES;

ACTIVATION ENERGY; CONDUCTIVE FILMS; DEPOSITION; ELECTRIC PROPERTIES; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; LEAD; NANOSTRUCTURES; ORGANIC LIGHT EMITTING DIODES (OLED); PERMITTIVITY; PHASE INTERFACES; PHASE TRANSITIONS; STRONTIUM; THERMOELECTRIC EQUIPMENT; THIN FILMS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77649228047 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2009.10.011 Document Type: Article

Times cited : (17)

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