Microstructure control of (Pb,Sr)TiO3 films on Pt/Ti/SiO2/Si substrates by a TiO2 buffer layer

Thin Solid Films

Volumn 516, Issue 6, 2008, Pages 1285-1289

  Chen, Lili ^a   Shen, Mingrong ^a   Fang, Liang ^a   Xu, Yu ^a  

^a SOOCHOW UNIVERSITY   (China)

Author keywords

Buffer layer; Electrical properties; Sol Gel

Indexed keywords

CURRENT DENSITY; LEAKAGE CURRENTS; MICROSTRUCTURE; SOL-GEL PROCESS; SUBSTRATES; SURFACE MORPHOLOGY; TITANIUM OXIDES;

CRYSTALLINITY; ELECTRICAL PROPERTIES; LEAKAGE CURRENT DENSITY;

BUFFER LAYERS;

EID: 37349049726     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.05.061     Document Type: Article

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