Dielectric properties of Ba0.6 Sr0.4 Ti O3 thin films using Pb0.3 Sr0.7 Ti O3 buffer layers

Applied Physics Letters

Volumn 91, Issue 25, 2007, Pages

  Wang, Sheng Xiang ^a,b   Hao, Jian Hua ^b   Wu, Zhen Ping ^b   Wang, Dan Yang ^b   Zhuo, Yue ^a   Zhao, Xing Zhong ^a  

^a WUHAN UNIVERSITY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; BUFFER LAYERS; DIELECTRIC PROPERTIES; ELECTROCHEMICAL ELECTRODES; MULTILAYER FILMS;

CAPACITOR STRUCTURES; INTEGRATED DEVICES; MULTILAYERED FILMS; ROOM TEMPERATURE; TUNABILITY;

THIN FILMS;

EID: 37549056937     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2827583     Document Type: Article

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