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Volumn 518, Issue 12, 2010, Pages 3246-3249

Local conduction in junctions composed of Pt and single-crystalline Nb-doped SrTiO3

Author keywords

Interfaces; Oxides; Strontium titanate

Indexed keywords

APPLIED VOLTAGES; CONDUCTING CHANNELS; CURRENT FLOWS; ELECTRICAL PROPERTY; ELECTRODE AREAS; JUNCTION CAPACITANCES; LINEAR RELATIONSHIPS; LOW-RESISTANCE STATE; NB-DOPED SRTIO; RESISTANCE STATE; SINGLE-CRYSTALLINE; STRONTIUM TITANATE; TEMPORAL CHANGE;

EID: 77649196713     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.10.165     Document Type: Article
Times cited : (3)

References (18)
  • 17
    • 77649217496 scopus 로고    scopus 로고
    • The dielectric constant of STO near the interface region is reported to exhibit the bias dependence, For example, see Ref. 1 If this dependence is taken into consideration, the dielectric constant decreases with bias voltage. Therefore the dielectric constant of 300 might overestimate the depletion layer width and makes the difference in capacitance between LRS and HRS larger than the value estimated by considering the bias dependence into account
    • The dielectric constant of STO near the interface region is reported to exhibit the bias dependence. (For example, see Ref. 1) If this dependence is taken into consideration, the dielectric constant decreases with bias voltage. Therefore the dielectric constant of 300 might overestimate the depletion layer width and makes the difference in capacitance between LRS and HRS larger than the value estimated by considering the bias dependence into account.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.