A new analytical model of the erasing operation in phase-change memories

IEEE Electron Device Letters

Volumn 31, Issue 3, 2010, Pages 198-200

  Chimenton, Andrea ^a   Zambelli, Cristian ^a   Olivo, Piero ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

Compact modeling; Erase operation; Nonvolatile memory; Phase change memory (PCM)

Indexed keywords

ANALYTICAL MODEL; ARCHITECTURAL PARAMETERS; COMPACT MODELING; CRYSTALLINE FRACTIONS; ELECTRONIC SWITCHING; ERASE OPERATION; FILAMENTATION; IN-PHASE; NON-VOLATILE MEMORIES; STATISTICAL ANALYSIS;

COMPUTER SIMULATION; MODELS; PULSE CODE MODULATION;

PHASE CHANGE MEMORY;

EID: 77649184676     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2038242     Document Type: Article

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