The thickness effect on the electrical conduction mechanism in titanium oxide thin films

Journal of Alloys and Compounds

Volumn 493, Issue 1-2, 2010, Pages 227-232

  Yildiz, A ^a,b   Serin, N ^b   Kasap, M ^c   Serin, T ^b   Mardare, Diana ^d  

^a AHI EVRAN UNIVERSITY   (Turkey)

^b ANKARA UNIVERSITY   (Turkey)

^c GAZI UNIVERSITY   (Turkey)

^d ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

Electrical properties; Grain boundary; Thickness; TiO2; Variable range hopping (VRH) conduction

Indexed keywords

CHARACTERISTIC PARAMETER; DENSITY OF STATE; DEPOSITION PROCESS; ELECTRICAL CONDUCTION; ELECTRICAL CONDUCTION MECHANISMS; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRICAL PROPERTY; FILMS THICKNESS; GLASS SUBSTRATES; GRAIN BARRIER; HIGH TEMPERATURE; HOPPING DISTANCES; HOPPING ENERGIES; LOW TEMPERATURES; LOW-TEMPERATURE CONDUCTIVITY; NANOSTRUCTURED TIO; POTENTIAL BARRIERS; REACTIVE GAS; SURFACE TRAP DENSITY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; THICKNESS EFFECT; TIO; TITANIUM OXIDE THIN FILMS; VARIABLE-RANGE HOPPING; VARIABLE-RANGE HOPPING CONDUCTION;

CHARGE TRAPPING; ELECTRIC CONDUCTIVITY; ELECTRIC NETWORK ANALYSIS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC FILMS; OXIDE FILMS; THIN FILMS; TITANIUM; TITANIUM OXIDES; WATER VAPOR;

GAS PERMEABLE MEMBRANES;

EID: 77249114091     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.12.061     Document Type: Article

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