메뉴 건너뛰기




Volumn 84, Issue 7, 2010, Pages 962-968

Deposition of nano-scaled CrTiAlN multilayer coatings with different negative bias voltage on Mg alloy by unbalanced magnetron sputtering

Author keywords

Bias voltage; CrTiAlN multilayer coatings; Deposition structure; Friction coefficient

Indexed keywords

ALN; ATOMIC CONCENTRATION; CLOSED-FIELD UNBALANCED MAGNETRON SPUTTERING; CR CONCENTRATION; CROSS-SECTIONAL MORPHOLOGY; CRTIALN; CRYSTALLOGRAPHIC STRUCTURE; DEPOSITION MODELS; FACE-CENTERED CUBIC; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FRICTION COEFFICIENT; FRICTION COEFFICIENTS; ION PLATING SYSTEMS; MAGNETRON SPUTTERING SYSTEMS; MG ALLOY; MULTI-LAYER-COATING; NEGATIVE BIAS; NEGATIVE SUBSTRATES; OPTICAL EMISSIONS; PROCESS PARAMETERS; STRUCTURE AND PROPERTIES; UNBALANCED MAGNETRON SPUTTERING; X-RAY PHOTOELECTRONS; XPS; XRD ANALYSIS;

EID: 77249113734     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2010.01.028     Document Type: Article
Times cited : (21)

References (34)
  • 4
    • 77249087935 scopus 로고    scopus 로고
    • United States Patent, 5556519
    • Teer D.G. United States Patent, 5556519
    • Teer, D.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.