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Volumn 84, Issue 7, 2010, Pages 962-968
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Deposition of nano-scaled CrTiAlN multilayer coatings with different negative bias voltage on Mg alloy by unbalanced magnetron sputtering
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Author keywords
Bias voltage; CrTiAlN multilayer coatings; Deposition structure; Friction coefficient
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Indexed keywords
ALN;
ATOMIC CONCENTRATION;
CLOSED-FIELD UNBALANCED MAGNETRON SPUTTERING;
CR CONCENTRATION;
CROSS-SECTIONAL MORPHOLOGY;
CRTIALN;
CRYSTALLOGRAPHIC STRUCTURE;
DEPOSITION MODELS;
FACE-CENTERED CUBIC;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
FRICTION COEFFICIENT;
FRICTION COEFFICIENTS;
ION PLATING SYSTEMS;
MAGNETRON SPUTTERING SYSTEMS;
MG ALLOY;
MULTI-LAYER-COATING;
NEGATIVE BIAS;
NEGATIVE SUBSTRATES;
OPTICAL EMISSIONS;
PROCESS PARAMETERS;
STRUCTURE AND PROPERTIES;
UNBALANCED MAGNETRON SPUTTERING;
X-RAY PHOTOELECTRONS;
XPS;
XRD ANALYSIS;
BIAS VOLTAGE;
CHROMIUM;
DEPOSITION;
FIELD EMISSION;
FIELD EMISSION MICROSCOPES;
FRICTION;
INORGANIC COATINGS;
ION IMPLANTATION;
MAGNETRONS;
MULTILAYERS;
OPTICAL MULTILAYERS;
PLATING;
PROTECTIVE COATINGS;
SCANNING ELECTRON MICROSCOPY;
TITANIUM NITRIDE;
TRIBOLOGY;
X RAY DIFFRACTION;
CHROMATE COATINGS;
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EID: 77249113734
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2010.01.028 Document Type: Article |
Times cited : (21)
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References (34)
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