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Volumn 11, Issue 2, 1999, Pages 249-257
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Use of X-ray photoelectron spectroscopy to characterize fine AlN powders submitted to mechanical attrition
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL DEFECTS;
DEGRADATION;
FRACTURE;
OXIDATION;
PARTICLES (PARTICULATE MATTER);
POWDER METALS;
SURFACE STRUCTURE;
SURFACE TREATMENT;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
MECHANICAL ATTRITION;
NANOMETRIC PASSIVATION LAYER;
SURFACE CHARACTERIZATION;
ALUMINUM COMPOUNDS;
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EID: 0344183053
PISSN: 09659773
EISSN: None
Source Type: Journal
DOI: 10.1016/S0965-9773(99)00038-0 Document Type: Article |
Times cited : (24)
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References (18)
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