Seebeck scanning microprobe for thermoelectric FGM

Materials Science Forum

Volumn 492-493, Issue , 2005, Pages 587-592

  Platzek, D ^a,b   Karpinski, G ^a   Drasar, C ^a,c   Muller E ^a  

^a GERMAN AEROSPACE CENTER DLR   (Germany)

^b Physics Technology Development and Consulting (PANCO)   (Germany)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Contact resistance; Generator; Homogeneity; Peltier effect; Potential probe; Scanning; Seebeck coefficient; Seebeck microprobe; Thermoelectric

Indexed keywords

CONVERSION EFFICIENCY; ELECTRIC CONDUCTIVITY; ELECTRIC GENERATORS; LINEARIZATION; PELTIER EFFECT; SCANNING; SEEBECK COEFFICIENT; SEEBECK EFFECT;

ELECTRICAL CONDUCTIVITY; MICROPROBE; TEMPERATURE RANGE; THERMAL SENSORS; THERMOELECTRIC GENERATOR;

FUNCTIONALLY GRADED MATERIALS;

EID: 28344443531     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-970-9.587     Document Type: Conference Paper

References (6)

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6. th Int. Conf. on Thermoelectrics, Beijing, China, June 2001, IEEE Piscataway, NJ, 2002, p. 298.