ToF-SIMS multivariate characterization of surfacemodification of polymers by N2-H2 atmospheric pressure dielectric barrier discharge

Surface and Interface Analysis

Volumn 42, Issue 2, 2010, Pages 102-109

  Sarra Bournet, C ^a   Poulin, S ^b   Piyakis, K ^b   Turgeona, S ^a   Larochea, G ^a  

^a UNIVERSITÉ LAVAL   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Atmospheric pressure; Dielectric barrier discharge; Multivariate analysis; PCA; Polymers; Surface analysis; Surface modification; ToF SIMS; XPS

Indexed keywords

ATMOSPHERIC PRESSURE DIELECTRIC BARRIER DISCHARGES; DIELECTRIC BARRIER DISCHARGE; MULTI VARIATE ANALYSIS; PCA; TOF SIMS; XPS;

ATMOSPHERIC CHEMISTRY; ATMOSPHERIC PRESSURE; ATMOSPHERICS; CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; DECISION MAKING; DIELECTRIC DEVICES; FLOW CONTROL; PLASMAS; SECONDARY ION MASS SPECTROMETRY; SURFACE ANALYSIS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

MULTIVARIANT ANALYSIS;

EID: 76749139544     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3177     Document Type: Article

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