ToF-SIMS observation of PTFE surfaces modified by α-particle irradiation

Surface and Interface Analysis

Volumn 37, Issue 9, 2005, Pages 713-720

  Fisher, Gregory L ^a   Ohlhausen, James A ^b   Wetteland, Christopher J ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

particle; Ionizing radiation; PTFE; Surface modification; ToF SIMS

Indexed keywords

FUNCTIONS; IRRADIATION; MOLECULAR STRUCTURE; PARTICLE SIZE ANALYSIS; POLYMERS; POLYTETRAFLUOROETHYLENES; SECONDARY ION MASS SPECTROMETRY; SURFACE TREATMENT; SURFACES;

Α-PARTICLE; IRRADIATION REGIME; TOF-SIMS; UNIRRADIATED POLYMERS;

SURFACE STRUCTURE;

EID: 24944563888     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2068     Document Type: Article

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