Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 6660-6663

  Boschmans, Bart ^a   Vanneste, Myriam ^b   Ruys, Luc ^b   Temmerman, Eef ^c   Leys, Christophe ^c   Van Vaeck, Luc ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b CENTEXBEL   (Belgium)

^c GHENT UNIVERSITY   (Belgium)

Author keywords

Atmospheric plasma; Charge build up; Polypropylene; Surface modification; TOF S SIMS

Indexed keywords

ELECTRON MICROSCOPY; OXYGEN; PLASMAS; POLYPROPYLENES; SURFACE TREATMENT; THIN FILMS;

ATMOSPHERIC PLASMA; CHARGE BUILD-UP; TOF S-SIMS;

SECONDARY ION MASS SPECTROMETRY;

EID: 33747159094     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.240     Document Type: Article

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