Electrochemical reactions in nanoionics - Towards future resistive switching memories

ECS Transactions

Volumn 25, Issue 6, 2009, Pages 431-437

  Waser, Rainer ^a,b,c   Valov, Ilia ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Section JARA FIT   (Germany)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FLASH MEMORY; GATE DIELECTRICS; HIGH-K DIELECTRIC; RRAM; SOLID ELECTROLYTES;

ELECTROCHEMICAL METALLIZATION (ECM); ELECTROCHEMICAL REACTIONS; LONG TERM STABILITY; LOW-POWER CONSUMPTION; RANDOM ACCESS MEMORY; RESISTIVE SWITCHING; RESISTIVE SWITCHING MEMORY; SWITCHING MECHANISM;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 76549121089     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3206642     Document Type: Conference Paper

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