Direct determination of trace elements in boron nitride powders by slurry sampling total reflection X-ray fluorescence spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 65, Issue 2, 2010, Pages 152-157

  Amberger, Martin A ^a   Höltig, Michael ^a   Broekaert, José A C ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

Boron nitride; Slurry sampling; Total reflection X ray fluorescence spectrometry; Zeta potentials

Indexed keywords

BOVINE LIVER; CERTIFIED REFERENCE MATERIALS; CONCENTRATION OF; CONCENTRATION RANGES; CORRELATION COEFFICIENT; DIRECT DETERMINATION; ETV ICP OES; GOOD STABILITY; GRAPHITE FURNACE ATOMIC ABSORPTION SPECTROMETRY; ICP-OES; INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY; INTERNAL STANDARD ELEMENT; LIMITS OF DETECTION; LINE INTENSITIES; POLYETHYLENIMINES; REFERENCE VALUES; SIGNAL-TO-BACKGROUND RATIO; SLURRY SAMPLING; SOLID SAMPLING; TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRIES; TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY; WET CHEMICALS;

ABSORPTION SPECTROSCOPY; ATOMIC ABSORPTION SPECTROMETRY; BORON; BORON DEPOSITS; CALCIUM; CHROMIUM; CONCENTRATION (PROCESS); ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; MANGANESE; MANGANESE COMPOUNDS; OPTICAL EMISSION SPECTROSCOPY; POLYETHYLENES; SILICON CARBIDE; SLURRIES; TITANIUM NITRIDE; TRACE ANALYSIS; TRACE ELEMENTS; ZETA POTENTIAL;

BORON NITRIDE;

EID: 76549092097     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2010.01.001     Document Type: Article

References (24)

1. Haubner M.R., Wilhelm R., and Weissenbacher B. High Performance Non-Oxide Ceramics II (2002), Springer Verlag, Berlin, Heidelberg 1-45
2. Greim J., and Schwetz K.A. Boron carbide, boron nitride, and metal borides. Ullmann's Encyclopedia of Industrial Chemistry (2002), Wiley-VCH, Weinheim
3. Hollemann A.F., and Wiberg E. Inorganic Chemistry. 1st ed (2001), Academic Press
4. Barth P., Haßler J., Kudik I., and Krivan V. Determination of trace impurities in boron nitride by graphite furnace atomic absorption spectrometry and electrothermal vaporization inductively coupled plasma optical emission spectrometry using solid sampling. Spectrochim. Acta Part B 62 (2007) 924-932
5. Bock R. Handbook of Decomposition Methods in Analytical Chemistry (1979), International Textbook, London
6. Hauptkorn S., and Krivan V. Determination of silicon in boron nitride by slurry sampling electrothermal atomic absorption spectrometry. Spectrochim. Acta Part B 49 (1994) 221-228
7. Krivan V., and Römmelt T. Determination of impurities in boron nitride powder by slurry sampling electrothermal atomic absorption spectrometry. J. Anal. At. Spectrom. 12 (1997) 137-141
8. Wang Z., Ni Z., Qiu D., Tao G., and Yang P. Characterization of ceramic suspension for slurry introduction in inductively coupled plasma optical emission spectrometry and application to aluminium nitride analysis. J. Anal. At. Spectrom. 20 (2005) 315-319
9. Wang Z., Qiu D., Tao G., and Yang P. Direct determination of trace metals in boron carbide by slurry introduction axial viewed inductively coupled plasma optical emission spectrometry. J. Anal. At. Spectrom 24 (2009) 1258-1261
10. Wang Z., Qiu D., Ni Z., Tao G., and Yang P. Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique. Anal. Chim. Acta 577 (2006) 288-294
11. Ebdon I., Foulks M.E., and Hill S. Direct atomic spectrometric analysis by slurry atomization. Part 9. Fundamental studies of refractory samples. J. Anal. At. Spectrom. 5 (1990) 67-73
12. Van Borm W.A.H., Broekaert J.A.C., Klockenkämper R., Tschöpel P., and Adams F. Aerosol sizing and transport studies with slurry nebulization in inductively coupled plasma spectrometry. Spectrochim. Acta Part B 46 (1991) 1033-1049
13. Varga I., Rierpl E., and Tusai A. Comparison of slurry preparation and microwave digestion of freshwater algae for multi-element analysis by total reflection X-ray fluorescence spectrometry. J. Anal. At. Spectrom. 14 (1999) 881-883
14. Barkács K., Varga A., Gál-Solymos K., and Záray G. Direct determination of metal concentrations in freshwater algae by total reflection X-ray fluorescence spectrometry. J. Anal. At. Spectrom. 14 (1999) 577-581
15. Cariati F., Fermo P., Gilardoni S., Galli A., and Milazzo M. A new approach for archeological ceramics analysis using total reflection X-ray fluorescence analysis. Spectrochim. Acta Part B 58 (2003) 177-184
16. Amberger M.A., and Broekaert J.A.C. Direct multielement determination of trace elements in boron carbide powders by total reflection X-ray fluorescence spectrometry and analysis of the powders by ICP atomic emission spectrometry subsequent to sample digestion. J. Anal. At. Spectrom. 24 (2009) 1517-1523
17. Csató I., Záray G.Y., Gál-Solymos K., and Hassler J. Direct analysis of silicon carbide powder by total reflection X-ray fluorescence spectrometry. Appl. Spectrosc. 51 (1997) 1067-1072
18. 3 powders by total reflection X-ray fluorescence spectrometry. Anal. Bioanal. Chem. 382 (2005) 1958-1964
19. Ney P. Zetapotentiale und Flotierbarkeit von Mineralien (1973), Springer Verlag, Wien
20. Sun J., and Gao L. Dispersing SiC powder and improving its rheological behaviour. J. Eur. Ceram. Soc. 21 (2001) 2447-2451
21. Wang J., and Gao L. Adsorption of polyethylenimine on nanosized zirconia particles in aqueous suspensions. J. Colloid Interface Sci. 216 (1999) 436-439
22. S2 Picofox® User Manual (2007), Bruker AXS Micranalysis GmbH
23. Hellin D., Fyen W., Rip J., Delande T., Mertens P.W., De Gent S., and Vinckier C. Saturation effects in TXRF on micro-droplet residue samples. J. Anal. At. Spectrom. 19 (2004) 1517-1523
24. Klockenkämper R., and von Bohlen A. Determination of the critical thickness and the sensitivity for thin-film analysis by total reflection X-ray fluorescence spectrometry. Spectrochim. Acta Part B 44 (1989) 461-469