Beyond the ability of Rietveld analysis: MEM-based pattern fitting

Solid State Ionics

Volumn 172, Issue 1-4 SPEC. ISS., 2004, Pages 1-6

  Izumi, Fujio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Disordered structure; Maximum entropy method; Powder diffraction

Indexed keywords

ALGORITHMS; CARRIER CONCENTRATION; CHEMICAL BONDS; CRYSTAL STRUCTURE; ELECTRONS; MATHEMATICAL MODELS; MOLECULES; PARAMETER ESTIMATION; X RAY DIFFRACTION ANALYSIS; ZEOLITES;

DISORDERED STRUCTURES; MAXIMUM ENTROPY METHOD; PATTERN FITTING; POWDER DIFFRACTION;

ENTROPY;

EID: 7644237240     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2004.04.023     Document Type: Conference Paper

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