Disordered distribution of K+ ions interlayered in KxTi2-x/3Lix/3O4(x = 0.8)

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 341, Issue , 2000, Pages 253-258

  Izumi, Fujio ^a   Ikeda, Takuji ^b   Sasaki, Takayoshi ^a   Kumazawa, Shintaro ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Electron density; Maximum entropy method; Positional disorder; Rietveld method; Whole pattern fitting; X ray powder diffraction

Indexed keywords

EID: 0142016575     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250008026149     Document Type: Article

References (10)

1. D. Groult, C. Mercy, and B. Raveau. J. Solid State Chem., 32, 289 (1980).
2. T. Sasaki, F. Kooli, M. Iida, Y. Michiue, S. Takenouchi, Y. Yajima, F. Izumi. B. C. Chakoumakos, and M. Watanabe, Chem. Mater., 10, 4123 (1998).
3. A. F. Reid, W. G. Mumme, and A. D. Wadsley, Acta Crystallogr., Sect. B, 24, 1228 (1968).
4. F. Izumi and T. Ikeda, Mater. Sci. Forum, in press.
5. S. Kumazawa. Y. Kubota. M. Takata. M. Sakata, and Y. Ishibashi, J. Appl. Crystallogr, 26, 453 (1993).
6. F. Izumi. S. Kumazawa, T. Ikeda, and T. Ida, in Powder Diffraction. edited by S. P. Sen Gupta (Allied Publ., New Delhi, 1998), pp. 24-36.
7. M. Takata, B. Umeda, E. Nishibori, M. Sakata, Y. Saito. M. Ohno, and H. Shinohara, Nature (London), 377, 46 (1995).
8. T. Ikeda, F. Izumi, T. Kodaira, and T. Kamiyama, Chem. Mater., 10, 3996 (1998).
9. T. Ikeda and F. Izumi, Adv. X-Ray Chem. Anal. Jpn., 30, 219 (1999).
10. R.D. Shannon. Acta Crystallogr. Sect. A. 32, 751 (1976).