MEM-based structure-refinement system REMEDY and its applications

Materials Science Forum

Volumn 378-381, Issue I, 2001, Pages 59-64

  Izumi, F ^a   Kumazawa, S ^a   Ikeda, T ^a   Hu, W Z ^a   Yamamoto, A ^a   Oikawa, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron density; Layered compound; Maximum entropy method; Nuclear density; Superconductor; Whole pattern fitting; Zeolite

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; CRYSTAL ATOMIC STRUCTURE; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; FOURIER TRANSFORMS; MAXIMUM PRINCIPLE; SUPERCONDUCTING MATERIALS; X RAY POWDER DIFFRACTION;

ATOMIC ARRANGEMENT; LAYERED COMPOUNDS; MAXIMUM ENTROPY METHOD; NUCLEAR DENSITY; RIETVELD ANALYSIS PROGRAM; WHOLE PATTERN FITTING;

ZEOLITES;

EID: 4243573479     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.378-381.59     Document Type: Conference Paper

References (18)

1. Powder diffraction