Structural Study of a High Ionic Conductor Rb4Cu 16I7.2Cl12.8

Materials Science Forum

Volumn 443-444, Issue , 2004, Pages 337-340

  Oikawa, K ^a,f   Kamiyama, T ^b   Kanno, R ^c   Izumi, F ^d   Ikeda, T ^d   Chakoumakos, B C ^e  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

^f HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Ionic Conductor; Maximum Entropy Method; Neutron Powder Diffraction; Rb 4Cu16I7.2Cl12.8; Rietveld Refinement

Indexed keywords

COMPUTER SOFTWARE; ELECTRIC CONDUCTORS; ENTROPY; IONIC CONDUCTION; NEUTRON DIFFRACTION; SINGLE CRYSTALS; X RAY DIFFRACTION;

IONIC CONDUCTORS; MAXIMUM-ENTROPY METHOD; NEUTRON POWDER DIFFRACTION; RB4CU16I7.2CL12.8; RIETVELD REFINEMENT;

RUBIDIUM COMPOUNDS;

EID: 0842283341     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (8)

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