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Materials Research Bulletin

Volumn 45, Issue 3, 2010, Pages 269-274

Electrochemical evaluation of the reliability of plasma-polymerized methylcyclohexane films

(4) Nam, Nguyen Dang a Ahn, Joung Ho a Lee, Nae Eung a Kim, Jung Gu a

a Sungkyunkwan University (South Korea)

Author keywords

A. Thin films; B. Plasma deposition; C. Impedance spectroscopy; C. Infrared spectroscopy; D. Surface properties

Indexed keywords

A. THIN FILMS; C. IMPEDANCE SPECTROSCOPY; C. INFRARED SPECTROSCOPY; D. SURFACE PROPERTIES; IMPEDANCE SPECTROSCOPY;

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHARGE TRANSFER; CHEMICAL VAPOR DEPOSITION; COATINGS; CONTACT ANGLE; DIELECTRIC MATERIALS; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; ION EXCHANGE; PLASMA DEPOSITION; PLASMAS; SODIUM CHLORIDE; SURFACE PROPERTIES; SURFACE ROUGHNESS; THIN FILMS; TRACE ANALYSIS;

DEPOSITION;

EID: 76349109458 PISSN: 00255408 EISSN: None Source Type: Journal
DOI: 10.1016/j.materresbull.2009.12.024 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.