Sol-gel derived aluminum doped zinc oxide for application as anti-reflection coating in terrestrial silicon solar cells

Thin Solid Films

Volumn 518, Issue 10, 2010, Pages 2649-2653

  Verma, Amita ^a   Khan, F ^a   Kumar, D ^a   Kar, M ^a   Chakravarty, B C ^a   Singh, S N ^a   Husain, M ^b  

^a NATIONAL PHYSICAL LABORATORY   (India)

^b JAMIA MILLIA ISLAMIA CENTRAL UNIVERSITY   (India)

Author keywords

Aluminum doped zinc oxide films; Antirefection coatings; Electrical properties and measurements; Optical properties; Silicon solar cells; Sol gel; X ray diffraction

Indexed keywords

AL-DOPED ZINC OXIDE; ALUMINUM DOPED ZINC OXIDE FILMS; ALUMINUM-DOPED ZINC OXIDE; ANNEALED FILMS; ANNEALING TEMPERATURES; ATOMIC RATIO; DESTRUCTIVE INTERFERENCE; ELECTRICAL PROPERTIES AND MEASUREMENTS; FLUORINE DOPED TIN OXIDE; OPTICAL TRANSMITTANCE; PACKED ARRAYS; POLYCRYSTALLINE; PREFERENTIAL GROWTH; REFLECTION PEAKS; REFLECTIVITY VALUES; SCANNING ELECTRON MICROSCOPIC; SI WAFER; SLIDE GLASS; THICKNESS OF THE FILM; WAVELENGTH RANGES; X-RAY DIFFRACTION INVESTIGATIONS;

ALUMINUM; ALUMINUM COATINGS; ANNEALING; COATINGS; DIFFRACTION; ELECTRIC PROPERTIES; FLUORINE; GELS; GLASS; LIGHT REFRACTION; OPTICAL FILMS; ORGANIC LIGHT EMITTING DIODES (OLED); ORGANIC POLYMERS; REFLECTION; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON SOLAR CELLS; SILICON WAFERS; SOL-GEL PROCESS; SOL-GELS; SOLAR CELLS; SOLS; SPIN GLASS; TIN; TITANIUM COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC COATINGS; ZINC OXIDE;

OXIDE FILMS;

EID: 76049091991     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.08.010     Document Type: Article

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