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Volumn 107, Issue 2, 2010, Pages

Raman and Fourier transform infrared study of substitutional carbon incorporation in rapid thermal chemical vapor deposited Si 1-x-yGexCy on (1 0 0) Si

(3) Wasyluk, Joanna a Perova, Tatiana S a Meyer, Francoise b

a TRINITY COLLEGE DUBLIN (Ireland)

b CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CARBON FILMS; GERMANIUM; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; VAPOR DEPOSITION;

CARBON CONCENTRATIONS; CARBON INCORPORATION; CHEMICAL VAPOR DEPOSITED; FOURIER TRANSFORM INFRARED STUDIES; INFRARED INTENSITY; NEAREST NEIGHBORS; RAMAN AND INFRARED SPECTROSCOPY; THEORETICAL CALCULATIONS;

SI-GE ALLOYS;

EID: 75749143529 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3284937 Document Type: Article

Times cited : (9)

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