Structure and defect characterization of multiferroic ReMnO3 films and multilayers by TEM

Nanotechnology

Volumn 21, Issue 7, 2010, Pages

  Jehanathan, Neerushana ^a   Lebedev, Oleg ^a   Gélard, Isabelle ^b   Dubourdieu, Catherine ^b   Van Tendeloo, Gustaaf ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CHARACTERIZATION; DEFECT FORMATION; GROWTH MODELS; LIQUID INJECTIONS; METALORGANIC CHEMICAL VAPOR DEPOSITION; MIS-ORIENTATION; MULTIFERROICS; NANO DOMAIN; PT(111); RARE-EARTH MANGANITE; SI SUBSTRATES; SIMULATED IMAGES; STRUCTURE AND ORIENTATION; STRUCTURE OF FILMS; TEM;

DEFECTS; EPITAXIAL FILMS; ERBIUM; FILM PREPARATION; HOLMIUM; INTERFACES (COMPUTER); METALLORGANIC CHEMICAL VAPOR DEPOSITION; MULTILAYERS; ORGANIC CHEMICALS; ORGANOMETALLICS; OXIDE MINERALS; PLATINUM; SUBSTRATES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 74949110507     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/7/075705     Document Type: Article

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