Crystallization behavior of ferroelectric YMnO3 thin films on Si(1 0 0) substrates

Journal of Crystal Growth

Volumn 234, Issue 2-3, 2002, Pages 454-458

  Yoo, Dong Chul ^a   Lee, Jeong Yong ^a   Kim, Ik Soo ^b   Kim, Yong Tae ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

A1. Transmission electron microscopy; B1. Yttrium compounds; B2. Ferroelectric materials

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; RAPID THERMAL ANNEALING; SEMICONDUCTING SILICON; THERMAL EXPANSION; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

METAL-FERROELECTRIC-SEMICONDUCTORS (MFS);

FERROELECTRIC THIN FILMS;

EID: 0036131510     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01729-8     Document Type: Article

References (12)