Correlation between the surface morphology and antiphase boundaries in ordered (GaIn)P

Thin Solid Films

Volumn 348, Issue 1, 1999, Pages 196-201

  Sass T ^a   Pietzonka, I ^a   Gottschalch, V ^a   Wagner, G ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); INTERFACES (MATERIALS); METALLORGANIC VAPOR PHASE EPITAXY; MORPHOLOGY; SEMICONDUCTING GALLIUM COMPOUNDS; SUBSTRATES; SUPERLATTICES; SURFACES; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

ANTIPHASE BOUNDARIES; BUNCHED SUPERSTEPS; EPITAXIAL LAYERS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; TERRACES; VICINAL REGIONS;

SEMICONDUCTING FILMS;

EID: 0344339097     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00133-9     Document Type: Article

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