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Volumn 19, Issue 2-3, 2010, Pages 166-170

Analysis of passivated diamond surface channel FET in dual-gate configuration - Localizing the surface acceptor

Author keywords

Charge centroid; FET; H termination; Lateral charge injection; Passivation

Indexed keywords

CHARGE CENTROID; DIAMOND SURFACES; DRAIN BIAS; DUAL GATES; FET; GATE CONFIGURATION; H-TERMINATION; MOS GATES; MOS-FET; MOSFET STRUCTURES; PASSIVATION LAYER; POTENTIAL PROBES; SHEET CHARGES; SURFACE CHANNEL;

EID: 74849122556     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2009.09.003     Document Type: Article
Times cited : (25)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.