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Volumn 96, Issue 2, 2010, Pages

A study on the temperature dependence of the threshold switching characteristics of Ge2 Sb2 Te5

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC EXPRESSIONS; CHALCOGENIDE MATERIALS; CRITICAL CONDUCTIVITY; DELAY TIME; PHYSICAL MODEL; TEMPERATURE DEPENDENCE; THERMALLY ACTIVATED HOPPING; THRESHOLD SWITCHING; TRANSPORT MECHANISM;

EID: 74549192781     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3275756     Document Type: Article
Times cited : (33)

References (23)
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    • P. W. Anderson, Phys. Rev. Lett. 0031-9007 34, 953 (1975). 10.1103/PhysRevLett.34.953
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    • R. A. Street and N. F. Mott, Phys. Rev. Lett. 0031-9007 35, 1293 (1975). 10.1103/PhysRevLett.35.1293
    • (1975) Phys. Rev. Lett. , vol.35 , pp. 1293
    • Street, R.A.1    Mott, N.F.2
  • 10
    • 34548647299 scopus 로고    scopus 로고
    • Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices
    • DOI 10.1063/1.2773688
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    • (2007) Journal of Applied Physics , vol.102 , Issue.5 , pp. 054517
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  • 17
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    • 0022-3093. 10.1016/0022-3093(70)90164-X
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    • (1970) J. Non-Cryst. Solids , vol.2 , pp. 504
    • Shanks, R.R.1
  • 18
    • 74549136338 scopus 로고    scopus 로고
    • -V measurement was performed at room temperature.
    • -V measurement was performed at room temperature.
  • 19
  • 20
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    • 0096-8250. 10.1103/PhysRev.123.474
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.