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Volumn 58, Issue 5, 2010, Pages 1861-1867
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Structural and morphological modification of PDMS thick film surfaces by ion implantation with the formation of strain-induced buckling domains
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Author keywords
Atomic force microscopy; Elastomeric polymers; Implantation; Scanning electron microscopy; X ray diffraction
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Indexed keywords
DISCRETE REGIONS;
DISORDERED REGIONS;
ELASTOMER FILMS;
ELASTOMER MATRIX;
ELASTOMERIC POLYMER;
ELASTOMERIC POLYMERS;
FIELD EMISSION SEM;
FUNCTIONALIZED;
HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES;
IMPLANTATION PROCESS;
METAL EVAPORATION;
METAL ION SPECIES;
MORPHOLOGICAL MODIFICATION;
SELF-ORGANIZED;
SEM;
SURFACE BUCKLING;
ATOMIC FORCE MICROSCOPY;
ATOMS;
BUCKLING;
CRACKS;
DIFFRACTION;
FIELD EMISSION;
ION BOMBARDMENT;
ION IMPLANTATION;
ION SOURCES;
METAL IONS;
OPTICAL MICROSCOPY;
OPTICAL PROPERTIES;
PLASTIC FILMS;
RUBBER;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
SILICONES;
SURFACE WAVES;
THICK FILMS;
THREE DIMENSIONAL;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
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EID: 74549146851
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2009.11.029 Document Type: Article |
Times cited : (11)
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References (38)
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