Surface charge estimation on hemispherical dielectric samples from EFM force gradient measurements

Journal of Electrostatics

Volumn 68, Issue 1, 2010, Pages 79-84

  Gomez, A ^a   Avila, A ^a   Hinestroza, Juan P ^b  

^a UNIVERSIDAD DE LOS ANDES   (Colombia)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

Charged dielectrics; EFM; Force gradient; Surface charge density

Indexed keywords

ANALYTICAL SOLUTIONS; DIELECTRIC CONSTANTS; ELECTROSTATIC FORCE MICROSCOPY; FORCE GRADIENTS; NUMERICAL MODELS; NUMERICAL RESULTS; QUANTITATIVE ASSESSMENTS; TIP-SAMPLE DISTANCE;

CHARGED PARTICLES; DIELECTRIC MATERIALS; ELECTROSTATIC FORCE; NUMERICAL ANALYSIS; SURFACE CHARGE;

ELECTRIC FORCE MICROSCOPY;

EID: 74449087140     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2009.11.002     Document Type: Article

References (22)

1. In: Bhushan, and Bharat (Eds). Springer Handbook of Nanotechnology. second rev. and extended ed. (2007) 325-385
2. Krauss T., and Burs L. Charge, polarizability and photoionization of single semiconductor nanocrystals. Phys. Rev Lett. 83 (1999) 4840-4843
3. Lu W., Wang D., and Chen L. Atomic-scale imaging in real and energy space developed in ultrafast electron microscopy. Nano. Lett. 7 (2007) 2729
4. Melin T., Deresmes D., and Stiévenard D. Charge injection in individual silicon nanoparticles deposited on a conductive substrate. Apply. Phys. Lett. 81 (2002) 5054
5. M Barboza A.P., Gomes A.P., Archanjo B.S., Araujo P.T., Jorio A., Ferlauto A.S., Mazooni M.S.C., Chacman H., and Neves B.R.A. Deformation induced semiconductor-metal transition in single wall carbon nanotubes probed by electric force microscopy. Phys. Review. Lett. 100 (2008) 256804
6. Bussmann E., Jun Kim Dong., and Williams C.C. Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy. Appl. Phys. Lett. 85 (2004) 2538
7. Kim J., Jasper W., and Hinestroza J. Direct probing of solvent-induced charge degradation in polypropylene electret fibres via electrostatic force microscopy. J. Microsc. 225 1 (Jan 2007) 72-79
8. Kim J., Jasper W., and Hinestroza J. Charge characterization of an electrically charged fiber via electrostatic force microscopy. J. Engineered Fibers and Fabrics 1 2 (2006) 30-46
9. Spanier J.E., Kolpak A.M., Urban J.J., Grinberget al I. Ferroelectric phase transition in individual single-crystalline BaTiO3 Nanowires. Nano. Lett. 6 (2006) 735
10. Sorokina K.L., and Tolstikhina A.L. Atomic force microscopy modified for studying electric properties of thin films and crystals. Review. Crystallography Reports 49 3 (2004) 476-499
11. Crosser M.S., Tessmer S.H., and Ghosh R.N. Scanning electric field sensing for semiconductor dopant profiling. Appl. Surf. Sci. 195 (2002) 146-154
12. Sacha G.M., and Sáenz J.J. Cantilever effects on electrostatic force gradient microscopy. Appl. Phys. Lett. 85 13 (Sept 2004) 2610-2612
13. Gomez-Moñivas S., Froufe L.S., Carminati R., Greffet J.J., and Saenz J.J. Tip-shape effects on electrostatic force microscopy resolution. Nanotechnology 12 (2001) 496-499
14. Sacha G.M., Gómez-Navarro C., Sáenz J.J., and Gómez-Herrero J. Quantitative theory for the imaging of conducting objects in electrostatic force microscopy. Appl. Phys. Lett. 89 (2006) 173122
15. Lyuksyutov S., Vaia R., Paramonov P., Juhl S., Waterhouse L., Ralich R., Sigalov G., and Sancaktar E. Electrostatic nanolithography in polymers using atomic force microscopy. Nat. Mater. 2 (2003) 468-472
16. B. Li, Y. Zhu, H. Zhou, J. Liu, High-performance hetero-nanocrystal memories, 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008, pp. 947-950.
17. Kim J., Hinestroza J.P., Jasper W., and Barker R.L. Effect of solvent exposure on the filtration performance of electrostatically charged polypropylene filter media. Text. Res. J. 79 (2009) 343-350
18. Mikromasch Corporation. Probe Catalog (Apr. 2008). http://www.spmtips.com/spm_probes/ Available online
19. Veeco Corp. AFM Probes (Apr. 2008). https://www.veecoprobes.com/search.asp?GroupID=42 Available online
20. Sacha G.M., Sahagún E., and Sáenz J.J. A method for calculating capacitances and electrostatic forces in atomic force microscopy. J. Appl. Phys. 101 (2007) 024310
21. Gomez A., Avila A., and Massy I. Electrostatic tip-dielectric sample interaction in electrostatic force microscopy. Rev. Fac. Ing. Univ. Antioq. 50 (Dec. 2009) 31-40
22. Brandrup, J.; Immergut, Edmund H.; Grulke, Eric A.; Abe, Akihiro; Bloch, Daniel R. Polymer Handbook, fourth ed., John Wiley & Sons.