Self-assembly of perylenediimide based semiconductor on polymer substrate

Thin Solid Films

Volumn 518, Issue 8, 2010, Pages 2266-2270

  Wiatrowski, Michal ^a   Dobruchowska, Ewa ^a   Maniukiewicz, Waldemar ^a   Pietsch, Ulrich ^b   Kowalski, Jacek ^a   Szamel, Zbigniew ^a   Ulanski, Jacek ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF SIEGEN   (Germany)

Author keywords

stacking; Conductivity; Ordered crystalline layer; Perylenediimide; Scanning electron microscopy; Self assembly; X ray diffraction

Indexed keywords

ANISOTROPIC DOMAINS; ATOMIC FORCE; BI-LAYER; CONDUCTIVITY; CRYSTALLINE LAYERS; GRAZING INCIDENCE; LONG AXIS; PERYLENEDIIMIDE DERIVATIVE; PERYLENEDIIMIDES; PERYLENES; POLYMER SUBSTRATE; POLYMER SURFACES; SCANNING ELECTRON MICROSCOPY IMAGE; SURFACE CONDUCTIVITY; SURFACE LAYERS; TEMPERATURE DEPENDENCE; WIDE ANGLE X-RAY SCATTERING;

ACTIVATION ENERGY; CRYSTALS; DIFFRACTION; ELECTRIC CONDUCTIVITY; SCANNING; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE MATERIALS;

EID: 74349128215     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.08.037     Document Type: Article

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