-
1
-
-
0038402418
-
Artificially layered heteropolytypic structures based on SiC polytypes: Molecular beam epitaxy, characterization and properties
-
DOI 10.1016/S0370-1573(02)00632-4, PII S0370157302006324
-
A. Fissel, Phys. Rep. 0370-1573 379, 149 (2003). 10.1016/S0370-1573(02) 00632-4 (Pubitemid 36571124)
-
(2003)
Physics Reports
, vol.379
, Issue.3-4
, pp. 149-255
-
-
Fissel, A.1
-
2
-
-
19944432861
-
Correlation between morphological defects, electron beam-induced current imaging, and the electrical properties of 4H-SiC Schottky diodes
-
DOI 10.1063/1.1829784, 013540
-
Y. Wang, G. N. Ali, M. K. Mikhov, V. Vaidyanathan, B. J. Skromme, B. Raghothamachar, and M. Dudley, J. Appl. Phys. 0021-8979 97, 013540 (2005). 10.1063/1.1829784 (Pubitemid 40191790)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.1
, pp. 0135401-01354010
-
-
Wang, Y.1
Ali, G.N.2
Mikhov, M.K.3
Vaidyanathan, V.4
Skromme, B.J.5
Raghothamachar, B.6
Dudley, M.7
-
3
-
-
0000164978
-
-
0951-3248
-
J. A. Powell, P. G. Neudeck, D. J. Larkin, J. W. Yana, and P. Pirouz, Inst. Phys. Conf. Ser. 0951-3248 137, 161 (1994).
-
(1994)
Inst. Phys. Conf. Ser.
, vol.137
, pp. 161
-
-
Powell, J.A.1
Neudeck, P.G.2
Larkin, D.J.3
Yana, J.W.4
Pirouz, P.5
-
4
-
-
0036530626
-
Growth of large high-quality SiC single crystals
-
DOI 10.1016/S0022-0248(01)02153-4, PII S0022024801021534
-
N. Ohtani, T. Fujimoto, M. Katsuno, T. Aigo, and H. Yashiro, J. Cryst. Growth 0022-0248 237-239, 1180 (2002). 10.1016/S0022-0248(01)02153-4 (Pubitemid 34550250)
-
(2002)
Journal of Crystal Growth
, vol.237-239
, pp. 1180-1186
-
-
Ohtani, N.1
Fujimoto, T.2
Katsuno, M.3
Aigo, T.4
Yashiro, H.5
-
5
-
-
8644289339
-
-
0255-5476. 10.4028/www.scientific.net/MSF.457-460.367
-
M. Yu. Gutkin, A. G. Sheinerman, T. S. Argunova, E. N. Mokhov, J. H. Je, Y. Hwu, and W. L. Tsai, Mater. Sci. Forum 0255-5476 457-460, 367 (2004). 10.4028/www.scientific.net/MSF.457-460.367
-
(2004)
Mater. Sci. Forum
, vol.457-460
, pp. 367
-
-
Gutkin, M.Yu.1
Sheinerman, A.G.2
Argunova, T.S.3
Mokhov, E.N.4
Je, J.H.5
Hwu, Y.6
Tsai, W.L.7
-
6
-
-
0036531456
-
Evolution of domain walls in 6H- and 4H-SiC single crystals
-
DOI 10.1016/S0022-0248(01)02154-6, PII S0022024801021546
-
D. Siche, H. -J. Rost, J. Doerschel, D. Schulz, and J. Wollweber, J. Cryst. Growth 0022-0248 237-239, 1187 (2002). 10.1016/S0022-0248(01)02154-6 (Pubitemid 34550251)
-
(2002)
Journal of Crystal Growth
, vol.237-239
, pp. 1187-1191
-
-
Siche, D.1
Rost, H.-J.2
Doerschel, J.3
Schulz, D.4
Wollweber, J.5
-
7
-
-
24644434375
-
-
1063-7745
-
T. S. Argunova, L. M. Sorokin, L. S. Kostina, J. H. Je, M. Yu. Gutkin, and A. G. Sheinerman, Crystallogr. Rep. 1063-7745 49, S33 (2004).
-
(2004)
Crystallogr. Rep.
, vol.49
, pp. 33
-
-
Argunova, T.S.1
Sorokin, L.M.2
Kostina, L.S.3
Je, J.H.4
Gutkin, M.Yu.5
Sheinerman, A.G.6
-
8
-
-
33751105216
-
Interaction of micropipes with foreign polytype inclusions in SiC
-
DOI 10.1063/1.2359686
-
M. Yu. Gutkin, A. G. Sheinerman, T. S. Argunova, J. M. Yi, M. U. Kim, J. H. Je, S. S. Nagalyuk, E. N. Mokhov, G. Margaritondo, and Y. Hwu, J. Appl. Phys. 0021-8979 100, 093518 (2006). 10.1063/1.2359686 (Pubitemid 44772568)
-
(2006)
Journal of Applied Physics
, vol.100
, Issue.9
, pp. 093518
-
-
Gutkin, M.Yu.1
Sheinerman, A.G.2
Argunova, T.S.3
Yi, J.M.4
Kim, M.U.5
Je, J.H.6
Nagalyuk, S.S.7
Mokhov, E.N.8
Margaritondo, G.9
Hwu, Y.10
-
9
-
-
34548213138
-
-
0163-1829. 10.1103/PhysRevB.76.064117
-
M. Yu. Gutkin, A. G. Sheinerman, T. S. Argunova, J. M. Yi, J. H. Je, S. S. Nagalyuk, E. N. Mokhov, G. Margaritondo, and Y. Hwu, Phys. Rev. B 0163-1829 76, 064117 (2007). 10.1103/PhysRevB.76.064117
-
(2007)
Phys. Rev. B
, vol.76
, pp. 064117
-
-
Gutkin, M.Yu.1
Sheinerman, A.G.2
Argunova, T.S.3
Yi, J.M.4
Je, J.H.5
Nagalyuk, S.S.6
Mokhov, E.N.7
Margaritondo, G.8
Hwu, Y.9
-
10
-
-
0031513697
-
-
0370-1972. 10.1002/1521-3951(199707)202:1<177::AID-PSSB177>3.0. CO;2-I
-
Yu. A. Vodakov, A. D. Roenkov, M. G. Ramm, E. N. Mokhov, and Yu. N. Makarov, Phys. Status Solidi B 0370-1972 202, 177 (1997). 10.1002/1521- 3951(199707)202:1<177::AID-PSSB177>3.0.CO;2-I
-
(1997)
Phys. Status Solidi B
, vol.202
, pp. 177
-
-
Vodakov, Yu.A.1
Roenkov, A.D.2
Ramm, M.G.3
Mokhov, E.N.4
Makarov, Yu.N.5
-
11
-
-
10044244519
-
International consortium on phase contrast imaging and radiology beamline at the Pohang Light Source
-
DOI 10.1063/1.1807000
-
S. Baik, H. S. Kim, M. H. Jeong, C. S. Lee, J. H. Je, Y. Hwu, and G. Margaritondo, Rev. Sci. Instrum. 0034-6748 75, 4355 (2004). 10.1063/1.1807000 (Pubitemid 40001740)
-
(2004)
Review of Scientific Instruments
, vol.75
, Issue.11
, pp. 4355-4358
-
-
Baik, S.1
Kim, H.S.2
Jeong, M.H.3
Lee, C.S.4
Je, J.H.5
Hwu, Y.6
Margaritondo, G.7
-
12
-
-
0039010244
-
-
0951-3248
-
E. N. Mokhov, A. D. Roenkov, Yu. A. Vodakov, G. V. Saparin, and S. K. Obyden, Inst. Phys. Conf. Ser. 0951-3248 142, 245 (1996).
-
(1996)
Inst. Phys. Conf. Ser.
, vol.142
, pp. 245
-
-
Mokhov, E.N.1
Roenkov, A.D.2
Vodakov, Yu.A.3
Saparin, G.V.4
Obyden, S.K.5
-
13
-
-
0031396609
-
-
0161-0457
-
G. V. Saparin, S. K. Obyden, P. V. Ivannikov, E. B. Shishkin, E. N. Mokhov, A. D. Roenkov, and D. H. Hofmann, Scanning 0161-0457 19, 269 (1997).
-
(1997)
Scanning
, vol.19
, pp. 269
-
-
Saparin, G.V.1
Obyden, S.K.2
Ivannikov, P.V.3
Shishkin, E.B.4
Mokhov, E.N.5
Roenkov, A.D.6
Hofmann, D.H.7
-
14
-
-
0004399274
-
-
0030-3941. 10.1364/JOSA.62.000341
-
J. A. Powell, J. Opt. Soc. Am. 0030-3941 62, 341 (1972). 10.1364/JOSA.62.000341
-
(1972)
J. Opt. Soc. Am.
, vol.62
, pp. 341
-
-
Powell, J.A.1
-
15
-
-
0000433335
-
-
0907-4449. 10.1107/S0365110X51001690
-
F. C. Frank, Acta Crystallogr. 0907-4449 4, 497 (1951). 10.1107/S0365110X51001690
-
(1951)
Acta Crystallogr.
, vol.4
, pp. 497
-
-
Frank, F.C.1
-
16
-
-
0026204898
-
-
0921-5093. 10.1016/0921-5093(91)90751-8
-
T. -Y. Zhang and J. C. M. Li, Mater. Sci. Eng., A 0921-5093 142, 35 (1991). 10.1016/0921-5093(91)90751-8
-
(1991)
Mater. Sci. Eng., A
, vol.142
, pp. 35
-
-
Zhang, T.-Y.1
Li, J.C.M.2
-
17
-
-
0000019455
-
-
0361-5235. 10.1007/s11664-997-0138-0
-
W. Si, M. Dudley, R. Glass, V. Tsvetkov, and C. Carter, Jr., J. Electron. Mater. 0361-5235 26, 128 (1997). 10.1007/s11664-997-0138-0
-
(1997)
J. Electron. Mater.
, vol.26
, pp. 128
-
-
Si, W.1
Dudley, M.2
Glass, R.3
Tsvetkov, V.4
Carter Jr., C.5
-
18
-
-
0002278671
-
-
edited by M. E. Levinstein, S. L. Rumyantsev, and M. S. Shur (Wiley, New York)
-
A. Goldberg, M. E. Levinstein, and S. L. Rumyantsev, in Properties of Advanced Semiconductor Materials GaN, AlN, InN, BN, SiC, SiGe, edited by, M. E. Levinstein, S. L. Rumyantsev, and, M. S. Shur, (Wiley, New York, 2001), p. 93.
-
(2001)
Properties of Advanced Semiconductor Materials GaN, AlN, InN, BN, SiC, SiGe
, pp. 93
-
-
Goldberg, A.1
Levinstein, M.E.2
Rumyantsev, S.L.3
-
21
-
-
0001509497
-
-
edited by F. R. N. Nabarro (North Holland, Amsterdam)
-
J. D. Eshelby, in Dislocations in Solids, edited by, F. R. N. Nabarro, (North Holland, Amsterdam, 1980), Vol. 1, p. 167.
-
(1980)
Dislocations in Solids
, vol.1
, pp. 167
-
-
Eshelby, J.D.1
|