SCOPUS 정보 검색 플랫폼

Volumn 24, Issue 4, 2009, Pages 231-235

Nanotribological characteristics of TiO2 films on sulphonated self-assembled monolayer of 3-mercaptopropyl trimethoxysilane

(2) Li, J a Cai, C L a

a SHANGHAI SECOND POLYTECHNIC UNIVERSITY (China)

Author keywords

AFM; Nanotribological characteristics; Sam; XPS

Indexed keywords

3-MERCAPTOPROPYL TRIMETHOXYSILANE; ADHESIVE FORCE; AFM; AFM TIP; ATOMIC FORCE MICROSCOPES; CAPILLARY FORCE; COMPOSITE THIN FILMS; FRICTION FORCE; HYDROPHOBIC PROPERTIES; IN-SITU; NORMAL LOADS; RELATIVE HUMIDITIES; SCANNING SPEED; SILANE COUPLING; SILICON SUBSTRATES; TIO; XPS;

ANGLE MEASUREMENT; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; CHEMISORPTION; COMPOSITE FILMS; CONTACT ANGLE; FRICTION; MOISTURE; NANOPROBES; NANOTRIBOLOGY; PLASMA JETS; SELF ASSEMBLED MONOLAYERS; THIN FILMS; TWO DIMENSIONAL; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 73849115738 PISSN: 10667857 EISSN: None Source Type: Journal
DOI: 10.1179/175355509X447212 Document Type: Article

Times cited : (4)

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