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Review of Scientific Instruments

Volumn 80, Issue 12, 2009, Pages

Analysis of thermoreflectance signals and characterization of thermal conductivity of metal thin films

(5) Miyake, Syugo a Kita, Takashi a Miyake, Aya b Ikeda, Ken Ichi b Takamatsu, Hiroyuki c

a KOBE UNIVERSITY (Japan)

b KOBELCO RESEARCH INSTITUTE INC (Japan)

c KOBE STEEL LTD (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC PROPERTIES; GLASS SUBSTRATES; METAL THIN FILM; PHASE LAGS; PT ALLOY; TEMPERATURE RESPONSE; THERMAL EFFUSIVITY; THERMAL PROPAGATION; THERMOREFLECTANCE;

COPPER; HEATING; METAL ANALYSIS; PLATINUM; PLATINUM ALLOYS; SUBSTRATES; THERMAL CONDUCTIVITY; THERMOANALYSIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 73849096814 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3265994 Document Type: Article

Times cited : (15)

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