Electron effective mean free path and thermal conductivity predictions of metallic thin films

Applied Physics Letters

Volumn 92, Issue 17, 2008, Pages

  Jin, Jae Sik ^a   Lee, Joon Sik ^b   Kwon, Ohmyoung ^c  

^a Seoul National University   (South Korea)

^b Seoul National University   (South Korea)

^c Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSITIONS; FILM THICKNESS; METALLIC FILMS; RELAXATION PROCESSES; THERMAL CONDUCTIVITY;

BOLTZMANN TRANSPORT EQUATION (BTE); ELECTRON EFFECTIVE MEAN FREE PATH;

THIN FILMS;

EID: 43049137674     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2917454     Document Type: Article

References (12)

1. E. H. Sondheimer, Adv. Phys. 1, 1 (1952).
2. A. F. Mayadas, R. Feder, and R. Rosenberg, J. Vac. Sci. Technol. 6, 690 (1969).
3. A. F. Mayadas and M. Shatzkes, Phys. Rev. B 1, 1382 (1970).
4. P. Nath and K. L. Chopra, Thin Solid Films 20, 53 (1974).
5. F. Kelemen, Thin Solid Films 36, 199 (1976).
6. A. T. Pugachev, Y. A. Volkov, and N. P. Churakova, J. Eng. Phys. Thermophys. 38, 352 (1980).
7. T. Q. Qiu and C. L. Tien, J. Heat Transfer 115, 842 (1993).
8. D. R. Penn and M. D. Stiles, Phys. Rev. B 59, 13338 (1999).
9. G. Chen and P. Hui, Appl. Phys. Lett. 74, 2942 (1999).
10. D. Chen, E. Li, E. Rosenbaum, and S.-M. Kang, IEEE Trans. Comput.-Aided Des. 19, 197 (2000).
11. C. L. Tien, A. Majumdar, and F. M. Gerner, Microscale Energy Transport (Taylor & Francis, Washington, DC, 1998).
12. P. G. Sverdrup, Y. S. Ju, and K. E. Goodson, J. Heat Transfer 123, 130 (2001).