Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Frétigny, Christian ^a,b   Roger, Jean Paul ^c   Reita, Valérie ^c   Fournier, Danièle ^c  

^a Centre National de la Recherche Scientifique   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; DIFFUSION; MICROSCOPIC EXAMINATION; THERMAL CONDUCTIVITY; THERMAL DIFFUSIVITY;

CONDUCTIVE LAYERS; PHOTOTHERMAL MEASUREMENTS; SURFACE TEMPERATURE; THERMOREFLECTANCE MICROSCOPY;

CONDUCTIVE MATERIALS;

EID: 37149038241     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2818102     Document Type: Article

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