Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution

Review of Scientific Instruments

Volumn 76, Issue 11, 2005, Pages 1-7

  Hatori, Kimihito ^a,b   Taketoshi, Naoyuki ^c   Baba, Tetsuya ^c   Ohta, Hiromichi ^a  

^a IBARAKI UNIVERSITY   (Japan)

^b Bethel Co   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; FUNCTIONALLY GRADED MATERIALS; LASER BEAMS; METALLIC FILMS; SAMPLING; SPUTTERING; THERMAL EFFECTS;

PERIODIC HEATING; SOLID MATERIALS; SPATIAL RESOLUTION; THERMAL EFFUSIVITY;

HEATING;

EID: 28444486937     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2130333     Document Type: Review

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