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Volumn 396, Issue 2-3, 2010, Pages 240-244

XRD contribution to the study of Cs-implanted cubic zirconia

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC COLLISIONS; CUBIC ZIRCONIA; DAMAGED LAYERS; DEPTH PROFILE; DISORDER LEVELS; ELASTIC STRAIN; FLUENCES; IMPLANTED SAMPLES; IN-PLANE; MATRIX; NORMAL STRAIN; RADIATION-INDUCED; RADIATION-INDUCED DAMAGES; ROOM TEMPERATURE; STRAINED LAYERS; STRONG CORRELATION; TEM; TEM ANALYSIS; XRD; XRD MEASUREMENTS;

EID: 73449101776     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2009.11.016     Document Type: Article
Times cited : (23)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.